Answer:
0.0244 (2.44%)
Step-by-step explanation:
defining the event T= the chips passes the tests , then
P(T)= probability that the chip is not defective * probability that it passes the test given that is not defective + probability that the chip is defective * probability that it passes the test given that is defective = 0.80 * 1 + 0.20 * 0.10 = 0.82
for conditional probability we can use the theorem of Bayes. If we define the event D=the chip was defective , then
P(D/T)=P(D∩T)/P(T) = 0.20 * 0.10/0.82= 0.0244 (2.44%)
where
P(D∩T)=probability that the chip is defective and passes the test
P(D/T)=probability that the chip is defective given that it passes the test