Question

The main difference between Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) is that SEM creates an image by detecting reflected or knocked-off electrons providing information on the sample's surface while TEM uses transmitted electrons (electrons that are passing through the sample) to create an image of the inner structure of the sample. Question 2 options: True False

Answer 1

According to the research, the correct option is true. SEM creates an image by detecting reflected or knocked-off electrons providing information on the sample's surface.

What is Scanning Electron Microscopy (SEM)?

It is an instrument that allows the observation and characterization of materials from the creation of an image is obtained from the signals emitted by the sample and is formed as the electron beam.

This technique is used to analyze the morphology of solid materials of all kinds, the study of cell cultures, provided through three-dimensional images that correspond to secondary electrons or backscattered electrons.

Therefore, we can conclude that according to the research, the correct option is true. SEM creates an image by detecting reflected or knocked-off electrons providing information on the sample's surface.

Learn more about Scanning Electron Microscopy here: brainly.com/question/16710784

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