Determine the coordinates for the intersection of the diagonals in RSTU with vertices at R(-8,-2),S(-6,7), T(6,7) and U(4,-2)

Mathematics

2 answers:

irina [24]3 years ago

6 0

It is answer choice A. (-1, 2.5)

Kamila [148]3 years ago

6 0

Answer:

A. (-1,2.5)

Step-by-step explanation:

We have been the coordinates of a an quadrilateral RSTU with vertices at R(-8,-2),S(-6,7), T(6,7) and U(4,-2). We are asked to find the coordinates for the intersection of the diagonals of RSTU.

First of let us draw the quadrilateral on coordinate plane.

Please find the attachment for the quadrilateral.

We can see that our given quadrilateral is a parallelogram. Now let us draw diagonals of our parallelogram.

We can see that both diagonals are intersecting at point (-1,2.5), therefore, option A is the correct choice.

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three trigonometric functions for a given angle are shown below csc theta = 13/12, sec theta = -13/5, cot theta = -5/12 what are

goldenfox [79]

We have that
csc ∅=13/12
sec ∅=-13/5
cot ∅=-5/12

we know that
csc ∅=1/sin ∅
sin ∅=1/ csc ∅------> sin ∅=12/13

sec ∅=-13/5
sec ∅=1/cos ∅
cos ∅=1/sec ∅------> cos ∅=-5/13

sin ∅ is positive and cos ∅ is negative
so
∅ belong to the II quadrant

therefore
<span>the coordinates of point (x,y) on the terminal ray of angle theta are
</span>x=-5
y=12

the answer is
point (-5,12)

see the attached figure

6 0

3 years ago

Read 2 more answers

The line width used for semiconductor manufacturing is assumed to be normally distributed with a mean of 0.5 micrometer and a st

Alinara [238K]

Answer:

There is a 0.82% probability that a line width is greater than 0.62 micrometer.

Step-by-step explanation:

Problems of normally distributed samples can be solved using the z-score formula.

In a set with mean $\mu$ and standard deviation $\sigma$ , the zscore of a measure X is given by

$Z = \frac{X - \mu}{\sigma}$

After finding the Z-score, we look at the z-score table and find the p-value associated with this z-score. This p-value is the probability that the value of the measure is smaller than X. The sum of the probabilities is decimal 1. So 1-pvalue is the probability that the value of the measure is larger than X.

In this problem

The line width used for semiconductor manufacturing is assumed to be normally distributed with a mean of 0.5 micrometer and a standard deviation of 0.05 micrometer, so $\mu = 0.5, \sigma = 0.05$ .