I put in the x coordinate for where y was 80 and the y coordinate for where x was 3. Then I subtracted them to get the slope. Hope this helps.
0.11 acres can be planted per pound of seed
<em><u>Solution:</u></em>
Given that it takes 63 pounds of seed to completely plant a 7 acre field
To find: acres can be planted per pound of seed
Let "x" be the acres which can be planted per pound of seed
Therefore, from given question,
63 pounds of seed = 7 acre field
1 pound of seed = "x" acre field
This forms a proportion and we can solve the sum by cross multiplying
Multiply the numerator of the left-hand fraction by the denominator of the right-hand fraction
Multiply the numerator of the right-hand fraction by the denominator of the left-hand fraction
Set the two products equal to each other
Solve for the variable
Thus 0.11 acres can be planted per pound of seed
Answer:
17
Step-by-step explanation:
If the number of the edges of the polyhedron is 14 and the vertices are 9. Then the number of the faces of the polyhedron is 7.
<h3>What is a
polyhedron?</h3>
A polyhedron is a solid made composed of polygons in three dimensions. It has vertices, flat faces, and straight edges.
We know the Euler's formula
F + V - E = 2,
where, F = number of faces, V = number of vertices, and E = number of edges
Edges: 14
Vertices: 9
F + 9 - 14 = 2
F = 14 + 2 - 9
F = 16 - 9
F = 7
Then the number of the faces of the polyhedron is 7.
More about the polyhedron link is given below.
brainly.com/question/2321456
#SPJ1
Answer:
0.0244 (2.44%)
Step-by-step explanation:
defining the event T= the chips passes the tests , then
P(T)= probability that the chip is not defective * probability that it passes the test given that is not defective + probability that the chip is defective * probability that it passes the test given that is defective = 0.80 * 1 + 0.20 * 0.10 = 0.82
for conditional probability we can use the theorem of Bayes. If we define the event D=the chip was defective , then
P(D/T)=P(D∩T)/P(T) = 0.20 * 0.10/0.82= 0.0244 (2.44%)
where
P(D∩T)=probability that the chip is defective and passes the test
P(D/T)=probability that the chip is defective given that it passes the test
