Answer:
Fabrication process that improves the yield from 0.92 to 0.95. The defects per area unit for 0.92 and 0.95 technology are 0.042 per cm^2 and 0.026 per cm^2 respectively
Explanation:
The yield is increased by a manufacturing procedure from 0.92 to 0.95 the defects will be;
Given Data
Suppose the area of the die is 2 Cm^2
The defects per unit area with a yield of 0.92 and 0.95 must be determined
Solution
Equation for yield
Yield= 1/(1+(defects × die area/2)^2
The yield equation has been rearranged
Defects= 2×(1√(yield)-1)/die area
First, we find for the technology of 0.92
Defects= 2×(1√(yield)-1)/die area
Putting the value of yield and die are which is 0.92 and 2Cm^2 respectively
Defects=2× (1√(0.92-1)/2
Defects= 0.042 per Cm^2
Now, find for the technology of 0.95
Putting the value of yield and die are which is 0.95 and 2Cm^2 respectively
Defects=2× (1√(0.95-1)/2
Defects=0.026 per Cm^2
