Answer:
0.0244 (2.44%)
Step-by-step explanation:
defining the event T= the chips passes the tests , then
P(T)= probability that the chip is not defective * probability that it passes the test given that is not defective + probability that the chip is defective * probability that it passes the test given that is defective = 0.80 * 1 + 0.20 * 0.10 = 0.82
for conditional probability we can use the theorem of Bayes. If we define the event D=the chip was defective , then
P(D/T)=P(D∩T)/P(T) = 0.20 * 0.10/0.82= 0.0244 (2.44%)
where
P(D∩T)=probability that the chip is defective and passes the test
P(D/T)=probability that the chip is defective given that it passes the test
−5ab2+2ab+a+2
That is the answer if you need more help on other questions use Math-way it helps answer all problems like that
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Answer: A.
Step-by-step explanation:
−1/3⋅(8 1/7)
change 8 1/7 to an improper fraction
8 1/7 = (7*8 +1)/7 = 57/7
-1/3 * 57/7
-57/21
21 goes into 57 2 times with 15 left over
-2 15/21
divide top and bottom of the fraction by 3
-2 5/7
Choice B
Answer:cab
Step-by-step explanation:
