Answer:
the critical flaw is subject to detection since this value of ac (16.8 mm) is greater than the 3.0 mm resolution limit.
Explanation:
This problem asks that we determine whether or not a critical flaw in a wide plate is subject to detection given the limit of the flaw detection apparatus (3.0 mm), the value of KIc (98.9 MPa m), the design stress (sy/2 in which s y = 860 MPa), and Y = 1.0.
Therefore, the critical flaw is subject to detection since this value of ac (16.8 mm) is greater than the 3.0 mm resolution limit.