Answer:
the elevation at point X is 2152.72 ft
Explanation:
given data
elev = 2156.77 ft
BS = 2.67 ft
FS = 6.72 ft
solution
first we get here height of instrument that is
H.I = elev + BS ..............1
put here value
H.I = 2156.77 ft + 2.67 ft
H.I = 2159.44 ft
and
Elevation at point (x) will be
point (x) = H.I - FS .............2
point (x) = 2159.44 ft - 6.72 ft
point (x) = 2152.72 ft
Answer:
(A) elemental, alloy, or compound thin films are deposited on to a bulk substrate
Explanation:
In film deposition there is process of depositing of material in form of thin films whose size varies between the nano meters to micrometers onto a surface. The material can be a single element a alloy or a compound.
This technology is very useful in semiconductor industries, in solar panels in CD drives etc
so from above discussion it is clear that option (a) will be the correct answer
Answer: hope it helps
Explanation:Moving air has a force that will lift kites and balloons up and down. Air is a mixture ... Here is a simple computer simulation that you can use to explore how wings make lift. ... All these dimensions together combine to control the flight of the plane. A pilot ... When the rudder is turned to one side, the airplane moves left or right.
Complete question:
A structural component in the form of a wide plate is to be fabricated from a steel alloy that has a plane strain fracture toughness of 98.9 MPa root m (90 ksi root in.) and a yield strength of 860 MPa (125,000 psi). The flaw size resolution limit of the flaw detection apparatus is 3.0 mm (0.12 in.). If the design stress is one-half of the yield strength and the value of Y is 1.0, determine whether or not a critical flaw for this plate is subject to detection.
Answer:
Since the flaw 17mm is greater than 3 mm the critical flaw for this plate is subject to detection
so that critical flow is subject to detection
Explanation:
We are given:
Plane strain fracture toughness K
Yield strength Y = 860 MPa
Flaw detection apparatus = 3.0mm (12in)
y = 1.0
Let's use the expression:
We already know
K= design
a = length of surface creak
Since we are to find the length of surface creak, we will make "a" subject of the formula in the expression above.
Therefore
Substituting figures in the expression above, we have:
= 0.0168 m
= 17mm
Therefore, since the flaw 17mm > 3 mm the critical flow is subject to detection
Senors are a type of device that produce a amount of change to the output to a known input stimulus.
Input signals are signals that receive data by the system and outputs the ones who are sent from it. Hope this helps ;)