Answer:
The number is 768
Explanation:
The given parameters of the three digits number are;
The number is a multiple of four, therefore, a factor of the number = 4
The value of the first digit = A prime number larger than 5
The sum of the last two digits > 10
The value of the ones (place value) digit > The tens (place value) digit
Let 'xyz' represent the digits of the three digits number, we have;
x = A prime number digit larger than 5
∴ x = 7
y + z > 10
z > y and z > x
Given that 4 is a factor of the number, we have;
4 is a factor of 'z'
4 is also a factor of yz
Therefore, the digit, z > 7 and z is divisible by 4, therefore, z = 8
y + z = y + 8 > 10
∴ y > 10 - 8
y > 2
The multiples of 4 larger than 728 with the last digit equal to 8 are found using Microsoft Excel and presented as follows;
748, 768, 788
The numbers that have a larger ones place value are; 748 and 768
The sum of the las two digits are therefore, 4 + 8 = 12 and 6 + 8 = 14
The number that has the largest ones place value for the sum of the last two digits is 768
The number is 768
Answer:
The constant here is the study outline
Explanation:
In scientific research, the constant variable is that part/variable of the experiment that does not change or is set not to change. Examples include temperature, environment or height.
Assuming the scenery described in this question is an experiment. All the groups presented are bound by a constant during the experiment. The constant here is the study outline. The study outline provided to the students is not going to change.
NOTE: There could be confusion as regards the answer being the final exam grade but that will be the dependent variable as that will be the outcome of the experiment while the time spent to study will be the independent variable.
Answer:
(a) The mean time to fail is 9491.22 hours
The standard deviation time to fail is 9491.22 hours
(b) 0.5905
(c) 3.915 × 10⁻¹²
(d) 2.63 × 10⁻⁵
Explanation:
(a) We put time to fail = t
∴ For an exponential distribution, we have f(t) =
Where we have a failure rate = 10% for 1000 hours, we have(based on online resource);
e^(1000·λ) - 0.1·e^(1000·λ) = 1
0.9·e^(1000·λ) = 1
1000·λ = ㏑(1/0.9)
λ = 1.054 × 10⁻⁴
Hence the mean time to fail, E = 1/λ = 1/(1.054 × 10⁻⁴) = 9491.22 hours
The standard deviation = √(1/λ)² = √(1/(1.054 × 10⁻⁴)²)) = 9491.22 hours
b) Here we have to integrate from 5000 to ∞ as follows;
(c) The Poisson distribution is presented as follows;
p(x = 3) = 3.915 × 10⁻¹²
d) Where at least 2 components fail in one half hour, then 1 component is expected to fail in 15 minutes or 1/4 hours
The Cumulative Distribution Function is given as follows;
p( t ≤ 1/4) .
Answer:
Explanation:
Since we are considering electron and hole drift velocities, then electric field E will have to be taken into consideration as well.
Where E = V/d...... 1
Drift velocity (u) = -μE. For electron.... 2
Drift velocity (v) = μE. For hole...... 3
Given that : V = 5V and d = 10 um (micro meter)
From equation 1
E = V/d
E = 5V/10×10^-4cm
E = 5V ÷1/1000
E = 5×1000
E = 5000v/cm
From equation 2
Un = -μE.
Un = - 1350cm^2/vs × 5000
= -6750000cm/s
From equation 3
Vp = μE
= 480cm^2/vs × 5000
= 2400000cm/s
Since it was stated in the question that we should contrast between hole drift and electron drift.
6750000/2400000
= 2.8125
Hence the electron drift velocity is 2.8 times that of hole drift velocity indicating that the speed of the electron through the silicon was faster.