The statement that correctly describes the circuit is the circuit provided is an example of a CMOS circuit.
<h3>What is a CMOS circuit?</h3>
The CMOS circuit is a term that is often known as "Complementary Metal Oxide Semiconductor."
This is known to be a machine that create integrated circuits and it is one that is often seen a a lot of electronic component and as such, the the circuit provided is an example of a CMOS circuit.
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Answer:
Yes it is possible
Explanation:
<u>Procedures to be taken:</u>
<u>Step 1:</u>
I will deform the specimen, that is, I will subject the specimen to plastic deformation at room temperature.
<u>Step 2:</u>
Also, I will anneal the deformed specimen at a high temperature.
<u>Step 3:</u>
Then, recrystallize the annealed specimen
<u>Step 4:</u>
Finally, I will facilitate the grain growth until the average grain diameter becomes 0.02mm.
Answer:
(N-1) × (L/2R) = (N-1)/2
Explanation:
let L is length of packet
R is rate
N is number of packets
then
first packet arrived with 0 delay
Second packet arrived at = L/R
Third packet arrived at = 2L/R
Nth packet arrived at = (n-1)L/R
Total queuing delay = L/R + 2L/R + ... + (n - 1)L/R = L(n - 1)/2R
Now
L / R = (1000) / (10^6 ) s = 1 ms
L/2R = 0.5 ms
average queuing delay for N packets = (N-1) * (L/2R) = (N-1)/2
the average queuing delay of a packet = 0 ( put N=1)
Answer:
A. optical isolation
Explanation:
well I can't really give a good explanation because I also saw the same question in my exams and option A was the correct answer
Answer:
the critical flaw length is 10.06 mm
Explanation:
Given the data in the question;
plane strain fracture toughness
= 92 Mpa√m
yield strength σ
= 900 Mpa
design stress is one-half of the yield strength ( 900 Mpa / 2 ) 450 Mpa
Y = 1.15
we know that;
Critical crack length
= 1/π(
/ Yσ )²
we substitute
= 1/π( 92 Mpa√m / (1.15 × 450 Mpa )²
= 1/π( 92 Mpa√m / (517.5 Mpa )²
= 1/π( 0.177777 )²
= 1/π( 0.03160466 )
= 0.01006 m = 10.06 mm
Therefore, the critical flaw length is 10.06 mm
{
= ( 10.06 mm ) > 3 mm
The critical flow is subject to detection