Question

Explain how a scanning electron microscope (SEM) can be used in combination with an energy dispersive X-ray spectrometer (EDS) to perform elemental analysis on extremely small particles by placing the statements in the order that they occur.

Answer 1

Answer:

SEM provides detailed high resolution images of the sample by rastering a focussed electron beam across the surface and detecting secondary or backscattered electron signal. An Energy Dispersive X-Ray Analyzer (EDX or EDA) is also used to provide elemental identification and quantitative compositional information.