Answer:
1.08
Explanation:
This is the case of interference in thin films in which interference bands are formed due to constructive interference of two reflected light waves , one from upper layer and the other from lower layer . If t be the thickness and μ be the refractive index then
path difference created will be 2μ t.
For light coming from rarer to denser medium , a phase change of π occurs additionally after reflection from denser medium, here, two times, once from upper layer and then from the lower layer , so for constructive interference
path diff = nλ , for minimum t , n =1
path diff = λ
2μ t. = λ
μ = λ / 2t
= 626 / 2 x 290
= 1.08
"Accuracy" would be the best option from the list regarding the property of a measurement that is best estimated from the percent error, since the higher the error is the lower the accuracy.
Explanation:
When taking scientific measurements, it's vital to be each correct and precise. Accuracy represents however shut a mensuration involves its true price. This can be vital as a result of unhealthy instrumentality, poor processing or human error will result in inaccurate results that aren't terribly getting ready to the reality.
Answer:
There is a localization of negative charge near the door handle.
Concave lens. These are used in making the objectives of reflection telescopes